1. Status of foreign LED related standards, current status of LED standards, current status of LED national standards--LED industry standards
Strictly speaking, not only is there no standard in China that is specifically named for semiconductor lighting, but there is currently no standard in foreign countries specifically named for semiconductor lighting. There are only standards for testing common LEDs and lighting standards related to ordinary light sources. Common LED test standards are:
(1) IEC60747-5 Semiconductor Equipments Discretedevices and Integrated Circuits (1992)
IEC60747-5 semiconductor discrete devices and integrated circuits
(2) IEC60747-5-2Discretesemiconductordevicesandintegratedcircuits-Part5-2: Opto electronicdevices-Essentialratingsandcharacteristics(1997-09)
IEC60747-5-2 Discrete Semiconductor Devices and Integrated Circuit Components 5-2: Optoelectronic Devices - Classification Features and Elements (1997-09)
(3) IEC60747-5-3Discretesemiconductordevicesandintegratedcircuits-Part5-3: Optoelectronicdevices-Measuringmethods(1997-08)
IEC60747-5-3 discrete semiconductor devices and integrated circuits
Parts 5-3: Optoelectronic Devices - Test Methods (1997-08)
(4) IEC60747-12-3Semiconductordevices-part12-3: optoelectronicdevices–Blankdetailspecificationforlight-emittingdiodes–Displayapplication(1998-02)
IEC60747-12-3 Semiconductor Discrete Device 12-3: Optoelectronic Devices - LED Blank Detail Standard for Display (1998-02)
(5) CIE127-1997Measurementof LEDs (1997)
CIE127-1997 LED test method (1997)
(6) CIE/ISOstandardsonLEDintensitymeasurements
CIE/IS OLED strength test standard
The International Commission on Illumination (CIE) published the CIE127-1997 LED test method in 1997, which determined the LED intensity test as the concept of average intensity, and specified a uniform test structure and detector size, which laid the foundation for accurate LED comparison test. Although the CIE127-1997 test method is not an international standard, it is easy to implement accurate test comparisons and has been adopted by major companies in the world. However, with the rapid development of technology, many new LED technology features are not covered by the CIE127-1997 LED test method.
At present, with the rapid development of the semiconductor lighting industry, developed countries attach great importance to the development of LED test standards. For example, the National Institute of Standards Testing (NIST) is conducting research on LED test methods and is preparing to establish a complete set of LED test methods and standards. At the same time, many foreign large companies' research and development personnel are actively participating in national and international specialized organizations to develop semiconductor lighting test standards. For example, on October 28, 2002, LumiLEDs of the United States and Nichia of Japan announced that they would cross-license their respective LED technologies and prepare to jointly develop power LED standards to promote market applications.
2. Status of domestic LED related standards--LED national standard
At present, there is no comprehensive national and LED industry test standards for LEDs and their lighting fixtures, and there is no corresponding detection system. In production, enterprises often use the parameters of sample pipe storage as the basis for comparison. Related manufacturers, users, research institutes, and universities of different natures often have great controversy. This inconsistency in standards within the academic community, within the corporate world, and between each other seriously hinders the application and industrialization of products. development of. Although some enterprises and research institutions have purchased some testing equipment, due to the lack of professional research, the equipment level is low, the instrument matching is poor, the detection accuracy is low, and the test results are not well compared with each other. The test items cannot meet the user's needs. Domestic professional testing institutions have carried out some LED testing and research work, but due to limited conditions, it is still impossible to form a complete testing and evaluation system, and the testing level is far from the developed countries.
Since the early 1980s, China has successively developed some industry standards and national standards related to light-emitting diodes. The existing standards related to LED testing in China are:
(1) Sj2353.3-83 semiconductor light-emitting diode test method
(2) Sj2658-86 semiconductor infrared light emitting diode test method
(3) GB/T12561-1990 LED blank detail specification
(4) GB/T15651-1995 Semiconductor device discrete devices and integrated circuits: optoelectronic devices (national standards)
(5) GB/T18904.3—2002 Semiconductor device 12-3: Blank detail specification for LEDs for display of optoelectronic devices (using IEC60747-12-3:1998)
(6) Semiconductor discrete devices and integrated circuits - Part 5-2: Basic ratings and characteristics of optoelectronic devices (national standard;
(7) Semiconductor discrete devices and integrated circuits - Part 5-3: Test methods for optoelectronic devices (national standard;
(8) Test method for semiconductor light-emitting diodes (China Optoelectronics Optoelectronic Devices Branch Standard; 2002)
Strictly speaking, not only is there no standard in China that is specifically named for semiconductor lighting, but there is currently no standard in foreign countries specifically named for semiconductor lighting. There are only standards for testing common LEDs and lighting standards related to ordinary light sources. Common LED test standards are:
(1) IEC60747-5 Semiconductor Equipments Discretedevices and Integrated Circuits (1992)
IEC60747-5 semiconductor discrete devices and integrated circuits
(2) IEC60747-5-2Discretesemiconductordevicesandintegratedcircuits-Part5-2: Opto electronicdevices-Essentialratingsandcharacteristics(1997-09)
IEC60747-5-2 Discrete Semiconductor Devices and Integrated Circuit Components 5-2: Optoelectronic Devices - Classification Features and Elements (1997-09)
(3) IEC60747-5-3Discretesemiconductordevicesandintegratedcircuits-Part5-3: Optoelectronicdevices-Measuringmethods(1997-08)
IEC60747-5-3 discrete semiconductor devices and integrated circuits
Parts 5-3: Optoelectronic Devices - Test Methods (1997-08)
(4) IEC60747-12-3Semiconductordevices-part12-3: optoelectronicdevices–Blankdetailspecificationforlight-emittingdiodes–Displayapplication(1998-02)
IEC60747-12-3 Semiconductor Discrete Device 12-3: Optoelectronic Devices - LED Blank Detail Standard for Display (1998-02)
(5) CIE127-1997Measurementof LEDs (1997)
CIE127-1997 LED test method (1997)
(6) CIE/ISOstandardsonLEDintensitymeasurements
CIE/IS OLED strength test standard
The International Commission on Illumination (CIE) published the CIE127-1997 LED test method in 1997, which determined the LED intensity test as the concept of average intensity, and specified a uniform test structure and detector size, which laid the foundation for accurate LED comparison test. Although the CIE127-1997 test method is not an international standard, it is easy to implement accurate test comparisons and has been adopted by major companies in the world. However, with the rapid development of technology, many new LED technology features are not covered by the CIE127-1997 LED test method.
At present, with the rapid development of the semiconductor lighting industry, developed countries attach great importance to the development of LED test standards. For example, the National Institute of Standards Testing (NIST) is conducting research on LED test methods and is preparing to establish a complete set of LED test methods and standards. At the same time, many foreign large companies' research and development personnel are actively participating in national and international specialized organizations to develop semiconductor lighting test standards. For example, on October 28, 2002, LumiLEDs of the United States and Nichia of Japan announced that they would cross-license their respective LED technologies and prepare to jointly develop power LED standards to promote market applications.
2. Status of domestic LED related standards--LED national standard
At present, there is no comprehensive national and LED industry test standards for LEDs and their lighting fixtures, and there is no corresponding detection system. In production, enterprises often use the parameters of sample pipe storage as the basis for comparison. Related manufacturers, users, research institutes, and universities of different natures often have great controversy. This inconsistency in standards within the academic community, within the corporate world, and between each other seriously hinders the application and industrialization of products. development of. Although some enterprises and research institutions have purchased some testing equipment, due to the lack of professional research, the equipment level is low, the instrument matching is poor, the detection accuracy is low, and the test results are not well compared with each other. The test items cannot meet the user's needs. Domestic professional testing institutions have carried out some LED testing and research work, but due to limited conditions, it is still impossible to form a complete testing and evaluation system, and the testing level is far from the developed countries.
Since the early 1980s, China has successively developed some industry standards and national standards related to light-emitting diodes. The existing standards related to LED testing in China are:
(1) Sj2353.3-83 semiconductor light-emitting diode test method
(2) Sj2658-86 semiconductor infrared light emitting diode test method
(3) GB/T12561-1990 LED blank detail specification
(4) GB/T15651-1995 Semiconductor device discrete devices and integrated circuits: optoelectronic devices (national standards)
(5) GB/T18904.3—2002 Semiconductor device 12-3: Blank detail specification for LEDs for display of optoelectronic devices (using IEC60747-12-3:1998)
(6) Semiconductor discrete devices and integrated circuits - Part 5-2: Basic ratings and characteristics of optoelectronic devices (national standard;
(7) Semiconductor discrete devices and integrated circuits - Part 5-3: Test methods for optoelectronic devices (national standard;
(8) Test method for semiconductor light-emitting diodes (China Optoelectronics Optoelectronic Devices Branch Standard; 2002)
Push In Wiring Connector,Classic Splicing Connector,Fast Splicing Connector,Wire Splicing Connector
Wonke Electric CO.,Ltd. , https://www.wkdq-electric.com